At present, most cellular telephone use time division multiple access (TDMA) standard, this kind of multiplexing technology uses 217Hz frequency to carry on / off pulse modulation to the high frequency carrier. IC will be vulnerable to the RF interference signal for the carrier demodulation, the regeneration of the 217Hz and its harmonic components of the signal. Due to the vast majority of these frequency components is in the audio range, so they will produce boring "buzz" sound.

In this paper, a general method for the suppression of RF noise in integrated circuits is described. RF anti interference ability test the circuit board can be controlled at the level of the RF signal, the RF level on behalf of the circuit may be subject to interference. This method can be used to obtain a standardized and structured test method, which can be used to test the quality of the test results. Such test results are helpful to the selection of IC, which can resist the circuit of RF noise.

The device (DUT) can be used to test the RF sensitivity of a cellular phone that is working. However, in order to obtain an accurate and repeatable test result, a fixed measurement method is needed to test the DUT in the RF field. Solution is to use RF anechoic test chamber to provide a can be precise control of RF field, the equivalent of a typical mobile phone RF field.